Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns |
| Journal |
Materials Science Forum (Volumes 157 - 162) |
| Volume |
Textures of Materials - ICOTOM 10 |
| Edited by |
H.J. Bunge |
| Pages |
149-158 |
| DOI |
10.4028/www.scientific.net/MSF.157-162.149 |
| Citation |
N.C. Krieger Lassen et al., 1994, Materials Science Forum, 157-162, 149 |
| Authors |
N.C. Krieger Lassen, Dorte Juul Jensen, K. Condradsen |
| Keywords |
Automation, Classification, Electron Back Scattering Patterns, Fourier Transform, Growth Rate, Image Processing, Recrystallization |
| Full Paper |
Get the full paper by clicking here
|
