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X-Ray Diffraction Study of Texture Evolution in Electrodeposited Zinc Layers

Journal Materials Science Forum (Volumes 157 - 162)
Volume Textures of Materials - ICOTOM 10
Edited by H.J. Bunge
Pages 1495-1500
DOI 10.4028/www.scientific.net/MSF.157-162.1495
Citation I. Tomov, 1994, Materials Science Forum, 157-162, 1495
Authors I. Tomov
Keywords Growth Selection, Oriented Growth, Oriented Nucleation, Texture Evolution, X-Ray Diffraction Method, Zinc Layers
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