Paper Title:
Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 157-162)
Edited by
H.J. Bunge
Pages
159-166
DOI
10.4028/www.scientific.net/MSF.157-162.159
Citation
B. Moreau, F. Wagner, H. Göbel, "Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements ", Materials Science Forum, Vols. 157-162, pp. 159-166, 1994
Online since
May 1994
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Price
$32.00
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