Paper Title:
Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 157-162)
Edited by
H.J. Bunge
Pages
201-206
DOI
10.4028/www.scientific.net/MSF.157-162.201
Citation
R. A. Schwarzer, "Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes ", Materials Science Forum, Vols. 157-162, pp. 201-206, 1994
Online since
May 1994
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Price
$32.00
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