Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes |
| Journal |
Materials Science Forum (Volumes 157 - 162) |
| Volume |
Textures of Materials - ICOTOM 10 |
| Edited by |
H.J. Bunge |
| Pages |
201-206 |
| DOI |
10.4028/www.scientific.net/MSF.157-162.201 |
| Citation |
Robert A. Schwarzer, 1994, Materials Science Forum, 157-162, 201 |
| Authors |
Robert A. Schwarzer |
| Keywords |
Ceramic, Electron Diffraction (ED), Gas Discharge, Insulators, Kikuchi Patterns, Sample Preparation, Scanning Electron Microscope (SEM), TEM |
| Full Paper |
Get the full paper by clicking here
|
