Paper Title:
Thickness and Density Determination for Ni-C-Ni Ultrathin Film by Photoemission and X-Ray Fluorescence Measurements under Total External Reflection
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 166-169)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
337-342
DOI
10.4028/www.scientific.net/MSF.166-169.337
Citation
E. Burattini, G. Cappuccio, V. Sessa, I.Y. Kharitonov, M.V. Kovalchuk, N.N. Novikova, A.N. Sosphenov, S.I. Zheludeva, "Thickness and Density Determination for Ni-C-Ni Ultrathin Film by Photoemission and X-Ray Fluorescence Measurements under Total External Reflection", Materials Science Forum, Vols. 166-169, pp. 337-342, 1994
Online since
July 1994
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