Paper Title:
Simulation of Stacking Faults Effect on X-Ray Patterns of Silicon Carbide
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 166-169)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
603-608
DOI
10.4028/www.scientific.net/MSF.166-169.603
Citation
B. F. Palosz, S. Stelmakh, S. Gierlotka, "Simulation of Stacking Faults Effect on X-Ray Patterns of Silicon Carbide", Materials Science Forum, Vols. 166-169, pp. 603-608, 1994
Online since
July 1994
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Price
$32.00
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