Paper Title:
Photothermal Deflection Spectroscopy on Amorphous Semiconductor Heterojunctions and Determination of the Interface Defect Densities
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 173-174)
Edited by
M. Briege, H. Dittrich, M. Klose, H.W. Schock, J. Werner
Pages
177-182
DOI
10.4028/www.scientific.net/MSF.173-174.177
Citation
F. Becker, R. Carius, J.-T. Zettler, J. Klomfass, C. Walker, H. Wagner, "Photothermal Deflection Spectroscopy on Amorphous Semiconductor Heterojunctions and Determination of the Interface Defect Densities", Materials Science Forum, Vols. 173-174, pp. 177-182, 1995
Online since
September 1994
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Price
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