Paper Title:
Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement
  Abstract

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Periodical
Materials Science Forum (Volumes 173-174)
Edited by
M. Briege, H. Dittrich, M. Klose, H.W. Schock, J. Werner
Pages
255-258
DOI
10.4028/www.scientific.net/MSF.173-174.255
Citation
C.H. Ling, H.K. Teoh, W.K. Choi, T.Q. Zhou, L.K. Ah, "Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement", Materials Science Forum, Vols. 173-174, pp. 255-258, 1995
Online since
September 1994
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Price
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