Paper Title:
Nondestructive and Contactless Evaluation of Electrical and Thermal Properties of Thin Semiconducting Layers
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Periodical
Materials Science Forum (Volumes 173-174)
Edited by
M. Briege, H. Dittrich, M. Klose, H.W. Schock, J. Werner
Pages
265-272
DOI
10.4028/www.scientific.net/MSF.173-174.265
Citation
H. D. Geiler, "Nondestructive and Contactless Evaluation of Electrical and Thermal Properties of Thin Semiconducting Layers", Materials Science Forum, Vols. 173-174, pp. 265-272, 1995
Online since
September 1994
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