Paper Title:
Characterization of the M. O. S. Structure by the Surface Photoelectrical Voltage Method
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 173-174)
Edited by
M. Briege, H. Dittrich, M. Klose, H.W. Schock, J. Werner
Pages
279-284
DOI
10.4028/www.scientific.net/MSF.173-174.279
Citation
B. Akkal, Z. Benamara, M. Chellali, H. Sehil, B. Gruzza, "Characterization of the M. O. S. Structure by the Surface Photoelectrical Voltage Method", Materials Science Forum, Vols. 173-174, pp. 279-284, 1995
Online since
September 1994
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Price
$32.00
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