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Optical and Electrical Properties of Semiconducting Thin Films Near the Deposition Substrate

Journal Materials Science Forum (Volumes 173 - 174)
Volume Semiconductor Processing and Characterization with Lasers
Edited by M. Briege, H. Dittrich, M. Klose, H.W. Schock, J. Werner
Pages 291-296
DOI 10.4028/www.scientific.net/MSF.173-174.291
Citation J. Ebothe, 1994, Materials Science Forum, 173-174, 291
Authors J. Ebothe
Keywords Electro-Optics, Semiconductor, Thin Film
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