Light and Electron Beams Scanning of Solar Cells |
| Journal |
Materials Science Forum (Volumes 173 - 174) |
| Volume |
Semiconductor Processing and Characterization with Lasers |
| Edited by |
M. Briege, H. Dittrich, M. Klose, H.W. Schock, J. Werner |
| Pages |
325-330 |
| DOI |
10.4028/www.scientific.net/MSF.173-174.325 |
| Citation |
S. Mil'shtein et al., 1994, Materials Science Forum, 173-174, 325 |
| Authors |
S. Mil'shtein, B. Bakker, S. Iatrou, D. Kharas, R.O. Bell |
| Keywords |
P-N Junction, Cells Efficiency, Dark Voltage Contrast, Field Profile, Potential Distribution, Scanning Electron Microscope (SEM), Solar Cell |
| Full Paper |
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