Application of Steady-State Photocarrier Grating Technique for Determination of Ambipolar Diffusion Lengths in Cu (In, Ga) (S, Se)2 - Thin Films for Solar Cells |
| Journal |
Materials Science Forum (Volumes 173 - 174) |
| Volume |
Semiconductor Processing and Characterization with Lasers |
| Edited by |
M. Briege, H. Dittrich, M. Klose, H.W. Schock, J. Werner |
| Pages |
337-342 |
| DOI |
10.4028/www.scientific.net/MSF.173-174.337 |
| Citation |
S. Zweigart et al., 1994, Materials Science Forum, 173-174, 337 |
| Authors |
S. Zweigart, R. Menner, R. Klenk, H.W. Schock |
| Keywords |
Ambipolar Diffusion Length Chalcopyrite, Steady-State Photocarrier Grating Technique |
| Full Paper |
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