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Semiconductor Processing and Characterization with Lasers

Materials Science Forum Volumes 173 - 174

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• p203 Near Infrared Quasi-Elastic Light Scattering Spectroscopy of Electronic Excitations in III-V Semiconductors   [ 255 K ]
  Authors: B.H. Bairamov, I.P. Ipatova, G. Irmer, J. Monecke, V.K. Negoduyko, V.A. Voitenko, V.V. Toporov
• p209 Laser Pulsed Induced Microwave Conductivity and Spectroscopic Ellipsometry Characterization of Helium and Hydrogen Plasma Damage of the Crystalline Silicon Surface   [ 294 K ]
  Authors: H.C. Neitzert, N. Layadi, Pere Roca i Cabarrocas, R. Vanderhaghen, M. Kunst
• p215 Laser Diagnostics of InSb Surface   [ 233 K ]
  Authors: G.V. Beketov, A.I. Liptuga
• p221 Contactless Characterization of Semiconductors Using Laser-Induced Surface Photo-Charge Voltage Measurements   [ 292 K ]
  Authors: A. Abbate, P. Rencibia, O. Ivanov, G. Masini, F. Palma, P. Das
• p227 Narrowing of Photoluminescence Line from Single Quantum Well under High Excitation Levels   [ 153 K ]
  Authors: D.G. Revin, V.Ya. Aleshkin
• p231 Resonance Raman Spectroscopy of Langmuir-Blodgett Films from Metallo-Phthalocyanines   [ 250 K ]
  Authors: Liudmila.L. Larina, N.N. Melnik, V.P. Poponin, O.I. Shevaleevskii, A.A. Kalachev
• p237 Raman and Nonlinear Light Scattering from Undersurface Layers of Ion Implanted Silicon Crystals   [ 241 K ]
  Authors: V.S. Gorelik
• p243 Raman Study of "Boson Peak" in Amorphous Silicon: Dependence on Hydrogen and Carbon Content   [ 218 K ]
  Authors: Mile Ivanda, I. Hartmann, F. Duschek, W. Kiefer
• p249 Structural Investigation of Microcrystalline Silicon   [ 543 K ]
  Authors: P. Hapke, M. Luysberg, Reinhard Carius, F. Finger, H. Wagner
• p255 Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement   [ 183 K ]
  Authors: C.H. Ling, H.K. Teoh, W.K. Choi, T.Q. Zhou, L.K. Ah
• p259 Investigation of Electronic Transport in Semiconductor Junctions by Photoinduced Laser Beam Deflection   [ 182 K ]
  Authors: P. Grunow, R. Schieck, M. Kunst
• p265 Nondestructive and Contactless Evaluation of Electrical and Thermal Properties of Thin Semiconducting Layers   [ 335 K ]
  Authors: Hans D. Geiler
• p273 Diagnostics of Semiconductor Surface by Laser-Induced Photovoltage   [ 285 K ]
  Authors: B. Pohoryles, A. Morawski
• p279 Characterization of the M. O. S. Structure by the Surface Photoelectrical Voltage Method   [ 210 K ]
  Authors: B. Akkal, Z. Benamara, M. Chellali, H. Sehil, B. Gruzza
• p285 Optical Second-Harmonic Generation (SHG) on Semiconductor Electrodes by Means of Femtosecond and Nanosecond-Pulse Lasers   [ 328 K ]
  Authors: W. Kautek, N. Sorg, Joachim Krüger