Defect Profiling with Pulsed e+-Beams |
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| Journal | Materials Science Forum (Volumes 175 - 178) |
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| Volume | Positron Annihilation - ICPA-10 |
| Edited by | Yuan-Jin He, Bi-Song Cao and Y.C. Jean |
| Pages | 107-114 |
| DOI | 10.4028/www.scientific.net/MSF.175-178.107 |
| Authors | Gottfried Kögel |
| Keywords | Defect Profiling, Defects Close to the Surface, Pulsed Positron Beams |
| Full Paper | 
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