Paper Title:
A Study of Defects in SiO2 Films on Si by Variable-Energy Positron Annihilation Spectroscopy
  Abstract

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Periodical
Materials Science Forum (Volumes 175-178)
Edited by
Yuan-Jin He, Bi-Song Cao and Y.C. Jean
Pages
157-160
DOI
10.4028/www.scientific.net/MSF.175-178.157
Citation
M. Fujinami, N.B. Chilton, "A Study of Defects in SiO2 Films on Si by Variable-Energy Positron Annihilation Spectroscopy", Materials Science Forum, Vols. 175-178, pp. 157-160, 1995
Online since
November 1994
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