Paper Title:
Annealing Processes of Vacancies in Silicon Induced by Electron Irradiation: Analysis Using Positron Lifetime Measurement
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Periodical
Materials Science Forum (Volumes 175-178)
Edited by
Yuan-Jin He, Bi-Song Cao and Y.C. Jean
Pages
423-426
DOI
10.4028/www.scientific.net/MSF.175-178.423
Citation
A. Kawasuso, M. Hasegawa, M. Suezawa, S. Yamaguchi, K. Sumino, "Annealing Processes of Vacancies in Silicon Induced by Electron Irradiation: Analysis Using Positron Lifetime Measurement", Materials Science Forum, Vols. 175-178, pp. 423-426, 1995
Online since
November 1994
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