Paper Title:
Experimental Determination of the Specific Positron Trapping Rates in Semiconductors
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 175-178)
Edited by
Yuan-Jin He, Bi-Song Cao and Y.C. Jean
Pages
427-430
DOI
10.4028/www.scientific.net/MSF.175-178.427
Citation
R. Krause-Rehberg, A. Polity, T. Abgarjan, "Experimental Determination of the Specific Positron Trapping Rates in Semiconductors", Materials Science Forum, Vols. 175-178, pp. 427-430, 1995
Online since
November 1994
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Price
$32.00
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