Paper Title:
The Use of Low Energy Positrons to Probe Defects in Langmuir-Blodgett Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 175-178)
Edited by
Yuan-Jin He, Bi-Song Cao and Y.C. Jean
Pages
533-536
DOI
10.4028/www.scientific.net/MSF.175-178.533
Citation
F.A. Smith, N. V. Seetala, M.A. Hill, C. Tucker, J. Oriel, "The Use of Low Energy Positrons to Probe Defects in Langmuir-Blodgett Films ", Materials Science Forum, Vols. 175-178, pp. 533-536, 1995
Online since
November 1994
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.