Paper Title:
Critical Thickness Determination of II-VI Semiconductors by Rheed and X-Ray Diffraction
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 182-184)
Edited by
H. Heinrich and J.B. Mullin
Pages
147-150
DOI
10.4028/www.scientific.net/MSF.182-184.147
Citation
D. Reisinger, M.J. Kastner, K. Wolf, H. Steinkirchner, W. Häckl, H. Stanzl, W. Gebhardt, "Critical Thickness Determination of II-VI Semiconductors by Rheed and X-Ray Diffraction", Materials Science Forum, Vols. 182-184, pp. 147-150, 1995
Online since
February 1995
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Price
$32.00
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