3-D Mapping of Strain and Defects in a ZnSE Epilayer Using a Variable Energy Electron Beam |
| Journal |
Materials Science Forum (Volumes 182 - 184) |
| Volume |
II-VI Compounds and Semimagnetic Semiconductors |
| Edited by |
H. Heinrich and J.B. Mullin |
| Pages |
163-166 |
| DOI |
10.4028/www.scientific.net/MSF.182-184.163 |
| Citation |
C. Trager-Cowan et al., 1995, Materials Science Forum, 182-184, 163 |
| Authors |
C. Trager-Cowan, A.M. Paterson, R.W. Martin, K.P. O'Donnell, J.T. Mullins, G. Horsburgh, K.A. Prior, B.C. Cavenett |
| Keywords |
Cathodoluminescence, Mapping, Profiling, Strain, ZnSe |
| Full Paper |
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