Analysis of Doping in ZnSe and ZnSSe by Far-Infrared Reflectance under Oblique Incidence |
| Journal |
Materials Science Forum (Volumes 182 - 184) |
| Volume |
II-VI Compounds and Semimagnetic Semiconductors |
| Edited by |
H. Heinrich and J.B. Mullin |
| Pages |
73-76 |
| DOI |
10.4028/www.scientific.net/MSF.182-184.73 |
| Citation |
J. Hermans et al., 1995, Materials Science Forum, 182-184, 73 |
| Authors |
J. Hermans, V. Offermann, J. Woitok, J. Geurts, H. Stanzl, W. Gebhardt |
| Keywords |
Doping, FIR-Reflectance, ZnSe, ZnSSe |
| Full Paper |
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