Passivation and Control of Semiconductor Interfaces by Interface Control Layers |
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| Journal | Materials Science Forum (Volumes 185 - 188) |
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| Volume | Passivation of Metals and Semiconductors |
| Edited by | K.E. Heusler |
| Pages | 23-36 |
| DOI | 10.4028/www.scientific.net/MSF.185-188.23 |
| Citation | Hisashi Hasegawa, 1995, Materials Science Forum, 185-188, 23 |
| Authors | Hisashi Hasegawa |
| Keywords | Interface States (or Traps), Semiconductor, Surface Passivation, Surface States |
| Full Paper | 
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