Paper Title:
AFM Observations of the Breakdown Damage in Anodic T2O5 Films
| Periodical |
Materials Science Forum (Volumes 185 - 188)
|
| Main Theme |
Passivation of Metals and Semiconductors
|
| Edited by |
K.E. Heusler |
| Pages |
251-260 |
| DOI |
10.4028/www.scientific.net/MSF.185-188.251 |
| Citation |
I. Montero et al., 1995, Materials Science Forum, 185-188, 251 |
| Authors |
I. Montero, J.M. Albella, L. Vázquez |
| Keywords |
Anodic Oxidation, Atomic Force Microscope (AFM), Breakdown Voltage, Morphology, Tantalum Oxide |
| Price |
US$ 28,- |