Paper Title:

AFM Observations of the Breakdown Damage in Anodic T2O5 Films

Periodical Materials Science Forum (Volumes 185 - 188)
Main Theme Passivation of Metals and Semiconductors
Edited by K.E. Heusler
Pages 251-260
DOI 10.4028/www.scientific.net/MSF.185-188.251
Citation I. Montero et al., 1995, Materials Science Forum, 185-188, 251
Authors I. Montero, J.M. Albella, L. Vázquez
Keywords Anodic Oxidation, Atomic Force Microscope (AFM), Breakdown Voltage, Morphology, Tantalum Oxide
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