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STM Images of Material Surfaces Deformed by Impingement of a Solid Ball and Characterizations of their Passive Films

Journal Materials Science Forum (Volumes 185 - 188)
Volume Passivation of Metals and Semiconductors
Edited by K.E. Heusler
Pages 261-266
DOI 10.4028/www.scientific.net/MSF.185-188.261
Citation Hiroshi Nanjo et al., 1995, Materials Science Forum, 185-188, 261
Authors Hiroshi Nanjo, N. Sanada, K. Koike
Keywords Deformation, Electronic Properties, Impact, Oxide Films, Spectroscopy, STM, Tunneling Current
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