Structure of Aluminium Oxide Films and its Changes due to Thermal and Electrochemical Processes |
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| Journal | Materials Science Forum (Volumes 185 - 188) |
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| Volume | Passivation of Metals and Semiconductors |
| Edited by | K.E. Heusler |
| Pages | 293-300 |
| DOI | 10.4028/www.scientific.net/MSF.185-188.293 |
| Citation | N.M. Yakovleva et al., 1995, Materials Science Forum, 185-188, 293 |
| Authors | N.M. Yakovleva, A.N. Yakovlev |
| Keywords | Aluminium, Anodic Films, Short Range Order (SRO), X-Ray Diffraction (XRD) |
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