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EXAFS Analysis of Passivating Films

Journal Materials Science Forum (Volumes 185 - 188)
Volume Passivation of Metals and Semiconductors
Edited by K.E. Heusler
Pages 301-312
DOI 10.4028/www.scientific.net/MSF.185-188.301
Citation H.-H. Strehblow et al., 1995, Materials Science Forum, 185-188, 301
Authors H.-H. Strehblow, P. Borthen
Keywords EXAFS, Grazing Incidence, Passive Layer, X-Ray Reflectivity
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