Methods to Determine the Composition of Passive Films: Recent Trends in XPS, AES and SIMS |
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| Journal | Materials Science Forum (Volumes 185 - 188) |
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| Volume | Passivation of Metals and Semiconductors |
| Edited by | K.E. Heusler |
| Pages | 313-324 |
| DOI | 10.4028/www.scientific.net/MSF.185-188.313 |
| Citation | D. Landolt et al., 1995, Materials Science Forum, 185-188, 313 |
| Authors | D. Landolt, P. Schmutz, H.J. Mathieu |
| Keywords | Passive Film, Stainless Steel (SS), Surface Analysis Method |
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