Paper Title:
Methods to Determine the Composition of Passive Films: Recent Trends in XPS, AES and SIMS
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 185-188)
Edited by
K.E. Heusler
Pages
313-324
DOI
10.4028/www.scientific.net/MSF.185-188.313
Citation
D. Landolt, P. Schmutz, H.J. Mathieu, "Methods to Determine the Composition of Passive Films: Recent Trends in XPS, AES and SIMS", Materials Science Forum, Vols. 185-188, pp. 313-324, 1995
Online since
March 1995
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Price
$32.00
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