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Electronic Structure of the Passivation Layer: New Computational Methods and Results

Journal Materials Science Forum (Volumes 185 - 188)
Volume Passivation of Metals and Semiconductors
Edited by K.E. Heusler
Pages 389-396
DOI 10.4028/www.scientific.net/MSF.185-188.389
Citation N. Yu et al., 1995, Materials Science Forum, 185-188, 389
Authors N. Yu, J.W. Halley
Keywords Defect, Electronic Structures, Rutile, Surface
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