Laser Interferometry and SMX-Techniques for Thermal Characterization of Thin Films |
| Journal |
Materials Science Forum (Volumes 185 - 188) |
| Volume |
Passivation of Metals and Semiconductors |
| Edited by |
K.E. Heusler |
| Pages |
43-52 |
| DOI |
10.4028/www.scientific.net/MSF.185-188.43 |
| Citation |
E. Oesterschulze et al., 1995, Materials Science Forum, 185-188, 43 |
| Authors |
E. Oesterschulze, L. Hadjiiski, M. Stopka, R. Kassing |
| Keywords |
Laser Interferometry, Photo-Thermal Techniques, Scanning Microscopy Techniques, Scanning Thermal Microscopy SThM, Thermal Characterzation |
| Full Paper |
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