Paper Title:
Laser Interferometry and SMX-Techniques for Thermal Characterization of Thin Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 185-188)
Edited by
K.E. Heusler
Pages
43-52
DOI
10.4028/www.scientific.net/MSF.185-188.43
Citation
E. Oesterschulze, L. Hadjiiski, M. Stopka, R. Kassing, "Laser Interferometry and SMX-Techniques for Thermal Characterization of Thin Films", Materials Science Forum, Vols. 185-188, pp. 43-52, 1995
Online since
March 1995
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Price
$32.00
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