Paper Title:
Ellipsometric Determination of the Density of TiO2 passive Films on Ti Single Crystals: Combination of Ellipsometry and Coulometry
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 185-188)
Edited by
K.E. Heusler
Pages
471-480
DOI
10.4028/www.scientific.net/MSF.185-188.471
Citation
A. Michaelis, J.-.L. Delplancke, J.W. Schultze, "Ellipsometric Determination of the Density of TiO2 passive Films on Ti Single Crystals: Combination of Ellipsometry and Coulometry", Materials Science Forum, Vols. 185-188, pp. 471-480, 1995
Online since
March 1995
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