Paper Title:
Determination of Interface State Density Distribution and Surface Recombination Velocity on Passivated Semiconductor Surfaces by Photoluminescence Surface State Spectroscopy
  Abstract

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Periodical
Materials Science Forum (Volumes 185-188)
Edited by
K.E. Heusler
Pages
53-58
DOI
10.4028/www.scientific.net/MSF.185-188.53
Citation
T. Saitoh, H. Hasegawa, "Determination of Interface State Density Distribution and Surface Recombination Velocity on Passivated Semiconductor Surfaces by Photoluminescence Surface State Spectroscopy", Materials Science Forum, Vols. 185-188, pp. 53-58, 1995
Online since
March 1995
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$32.00
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