Paper Title:
Structure Inhomogeneities of the Oxide Dielectric and the Properties of Tantalum Capacitors
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 185-188)
Edited by
K.E. Heusler
Pages
573-580
DOI
10.4028/www.scientific.net/MSF.185-188.573
Citation
S.D. Khanin, "Structure Inhomogeneities of the Oxide Dielectric and the Properties of Tantalum Capacitors", Materials Science Forum, Vols. 185-188, pp. 573-580, 1995
Online since
March 1995
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Price
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