Non-Steady State C-V Methods for Determination of Interface State Parameters |
| Journal |
Materials Science Forum (Volumes 185 - 188) |
| Volume |
Passivation of Metals and Semiconductors |
| Edited by |
K.E. Heusler |
| Pages |
59-64 |
| DOI |
10.4028/www.scientific.net/MSF.185-188.59 |
| Citation |
K.L. Temnikov et al., 1995, Materials Science Forum, 185-188, 59 |
| Authors |
K.L. Temnikov, I.A. Uritskaya |
| Keywords |
Cross Section, C-V Characteristics, Demarcation Energy Level, Density of Surface States, Minority Carriers, MIS Structure |
| Full Paper |
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