Paper Title:
Logarithmic Kinetics of the Ion Charge Accumulation in the SiO2 Dielectric Layers
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 185-188)
Edited by
K.E. Heusler
Pages
591-600
DOI
10.4028/www.scientific.net/MSF.185-188.591
Citation
V.N. Ovsyuk, "Logarithmic Kinetics of the Ion Charge Accumulation in the SiO2 Dielectric Layers", Materials Science Forum, Vols. 185-188, pp. 591-600, 1995
Online since
March 1995
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