Paper Title:
Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 189-190)
Main Theme
Edited by
B.C. Muddle
Pages
115-120
DOI
10.4028/www.scientific.net/MSF.189-190.115
Citation
P. J. Warren, C.R.M. Grovenor, "Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys", Materials Science Forum, Vols. 189-190, pp. 115-120, 1995
Online since
July 1995
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Price
$32.00
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