HRTEM Study of Atomic Faceting Interfaces of Σ=3 NiSi2/Si on (011) Si Substrate |
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| Journal | Materials Science Forum (Volumes 189 - 190) |
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| Volume | Interfaces II |
| Edited by | B.C. Muddle |
| Pages | 135-142 |
| DOI | 10.4028/www.scientific.net/MSF.189-190.135 |
| Citation | W.J. Chen et al., 1995, Materials Science Forum, 189-190, 135 |
| Authors | W.J. Chen, F.-R. Chen |
| Keywords | Atomic Faceting Interfaces, High Resolution Electron Microscopy (HREM), Σ=3 NiSi2/Si |
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