Interdiffusion in Pd/Cu Multilayered Film |
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| Journal | Materials Science Forum (Volumes 189 - 190) |
|---|---|
| Volume | Interfaces II |
| Edited by | B.C. Muddle |
| Pages | 411-416 |
| DOI | 10.4028/www.scientific.net/MSF.189-190.411 |
| Citation | Y.P. Lee et al., 1995, Materials Science Forum, 189-190, 411 |
| Authors | Y.P. Lee, Insu Jeon, Jun Hwa Hong, J.H. Moon, J.I. Jeong, J.S. Kang |
| Keywords | AES Depth Profiling, Interdiffusion, Pd/Cu Multilayered Film, Thermal Stability |
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