Surface/Interface X-Ray Diffraction |
| Journal |
Materials Science Forum (Volumes 189 - 190) |
| Volume |
Interfaces II |
| Edited by |
B.C. Muddle |
| Pages |
95-106 |
| DOI |
10.4028/www.scientific.net/MSF.189-190.95 |
| Citation |
Haydn Chen, 1995, Materials Science Forum, 189-190, 95 |
| Authors |
Haydn Chen |
| Keywords |
2D Diffraction Rods, Ag, Au, Bonding Distance of Surface Atoms, Buried Interfaces, C60 Bucky Balls, Crystal Truncation Rods (CTR), Cu, Difference Fourier Map, Dimer-Adatom-Stacking-Fault (DAS) Model, Epitaxial Relationship, Fractional-Order Reflections, Ge, Grazing-Incidence X-Ray Scattering (GIXS), In-Plane Scans, InSb, Integer-Order Reflections, Interface X-Ray Diffraction, Multi-Layer, NiSi2, Patterson Function, Roughening Transition, Silicon, Specular Reflection, Standing Wave Method, Surface Reconstruction, Surface Roughness (SR), Surface X-Ray Diffraction, Synchrotron Radiation (XRD), Total External Reflection |
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