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Chemical Interactions in Titanium-Implanted Fused Silica

Journal Materials Science Forum (Volume 195)
Volume Nanophase Materials
Edited by E. Bonetti and D. Fiorani
Pages 49-54
DOI 10.4028/www.scientific.net/MSF.195.49
Citation R. Bertoncello et al., 1995, Materials Science Forum, 195, 49
Authors R. Bertoncello, G. Battaglin, Elti Cattaruzza, Francesco Gonella, G. Mattei, P. Mazzoldi, F. Trivillin
Keywords Ion Beam Deposition, Ion-Implantation, Nanocluster, TEM, X-Ray Photoelectron Spectroscopy (XPS)
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