Paper Title:
Frenkel Defects in Low Temperature e-- Irradiated Ge and Si Investigated by X-Ray Diffraction
  Abstract

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Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
1141-1146
DOI
10.4028/www.scientific.net/MSF.196-201.1141
Citation
S. Bausch, H. Zillgen, P. Ehrhart, "Frenkel Defects in Low Temperature e-- Irradiated Ge and Si Investigated by X-Ray Diffraction", Materials Science Forum, Vols. 196-201, pp. 1141-1146, 1995
Online since
November 1995
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