Paper Title:
Oscillator Strengths and Linewidths of Shallow Impurity Spectra in Si and Ge
  Abstract

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Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
121-126
DOI
10.4028/www.scientific.net/MSF.196-201.121
Citation
B. A. Andreev, E.B. Kozlov, T.M. Lifshits, "Oscillator Strengths and Linewidths of Shallow Impurity Spectra in Si and Ge", Materials Science Forum, Vols. 196-201, pp. 121-126, 1995
Online since
November 1995
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Price
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