Oscillator Strengths and Linewidths of Shallow Impurity Spectra in Si and Ge |
| Journal |
Materials Science Forum (Volumes 196 - 201) |
| Volume |
Defects in Semiconductors 18 |
| Edited by |
M. Suezawa and H. Katayama-Yoshida |
| Pages |
121-126 |
| DOI |
10.4028/www.scientific.net/MSF.196-201.121 |
| Citation |
Boris A. Andreev et al., 1995, Materials Science Forum, 196-201, 121 |
| Authors |
Boris A. Andreev, E.B. Kozlov, T.M. Lifshits |
| Keywords |
Ge, Infrared Absorption, PTIS, Shallow Impurity, Silicon |
| Full Paper |
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