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Carbon Induced Inhomogeneous Strain Splitting of the Phosphorus Bound Exciton Line in Silicon

Journal Materials Science Forum (Volumes 196 - 201)
Volume Defects in Semiconductors 18
Edited by M. Suezawa and H. Katayama-Yoshida
Pages 133-138
DOI 10.4028/www.scientific.net/MSF.196-201.133
Citation A.N. Safonov et al., 1995, Materials Science Forum, 196-201, 133
Authors A.N. Safonov, Edward C. Lightowlers, Gordon Davies
Keywords Bound Exciton, Carbon, Line-Broadening, Silicon
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