Paper Title:
New Experimental Methods of Detection the Paramagnetic Recombination Centers in Silicon P-N Junctions and Diodes
  Abstract

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Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
1537-1542
DOI
10.4028/www.scientific.net/MSF.196-201.1537
Citation
L.S. Vlasenko, M.P. Vlasenko, "New Experimental Methods of Detection the Paramagnetic Recombination Centers in Silicon P-N Junctions and Diodes", Materials Science Forum, Vols. 196-201, pp. 1537-1542, 1995
Online since
November 1995
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Price
$32.00
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