Paper Title:
Defects in Porous Silicon: A Study with Optical and Spin Resonance Methodes
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
1673-1678
DOI
10.4028/www.scientific.net/MSF.196-201.1673
Citation
D.M. Hofmann, B.K. Meyer, P. Christmann, T. Wimbauer, W. Stadler, A. Nikolov, A. Scharmann, A. Hofstätter, "Defects in Porous Silicon: A Study with Optical and Spin Resonance Methodes", Materials Science Forum, Vols. 196-201, pp. 1673-1678, 1995
Online since
November 1995
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Price
$32.00
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