Paper Title:
Spatial Distribution of Microdefects around Dislocations in Si-Doped GaAs
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
1785-1790
DOI
10.4028/www.scientific.net/MSF.196-201.1785
Citation
R. Toba, M. Warashina, M. Tajima, "Spatial Distribution of Microdefects around Dislocations in Si-Doped GaAs", Materials Science Forum, Vols. 196-201, pp. 1785-1790, 1995
Online since
November 1995
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Price
$32.00
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