Paper Title:
Photoluminescence Defect Diagnostics in Poly-Si Thin Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
1897-1902
DOI
10.4028/www.scientific.net/MSF.196-201.1897
Citation
S. S. Ostapenko, A.U. Savchuk, G. Nowak, J. Lagowski, L. Jastrzebski, "Photoluminescence Defect Diagnostics in Poly-Si Thin Films", Materials Science Forum, Vols. 196-201, pp. 1897-1902, 1995
Online since
November 1995
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Price
$32.00
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