Paper Title:
Photoluminescence Study on Point Defects in SIMOX Buried SiO2 Film
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
1909-1914
DOI
10.4028/www.scientific.net/MSF.196-201.1909
Citation
K.S. Seol, A. Ieki, Y. Ohki, H. Nishikawa, M. Tachimori, "Photoluminescence Study on Point Defects in SIMOX Buried SiO2 Film", Materials Science Forum, Vols. 196-201, pp. 1909-1914, 1995
Online since
November 1995
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Price
$32.00
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