Paper Title:
Atomic-Scale Studies of Point Defects in Compound Semiconductors by Scannig Tunneling Microscopy
  Abstract

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Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
1949-1954
DOI
10.4028/www.scientific.net/MSF.196-201.1949
Citation
S. Gwo, S. Miwa, H. Ohno, J. F. Fan, H. Tokumoto, "Atomic-Scale Studies of Point Defects in Compound Semiconductors by Scannig Tunneling Microscopy", Materials Science Forum, Vols. 196-201, pp. 1949-1954, 1995
Online since
November 1995
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