Identification of Phonon Scattering Resonances with Defects in Gallium Arsenide |
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| Journal | Materials Science Forum (Volumes 196 - 201) |
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| Volume | Defects in Semiconductors 18 |
| Edited by | M. Suezawa and H. Katayama-Yoshida |
| Pages | 219-224 |
| DOI | 10.4028/www.scientific.net/MSF.196-201.219 |
| Citation | F. Maier et al., 1995, Materials Science Forum, 196-201, 219 |
| Authors | F. Maier, R. Eilenberger, Werner Beck, K. Lassmann |
| Keywords | Defects in GaAs, Phonon Spectroscopy |
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